SC-SPL

Silicon Wafer PL Module

Overview

PL for raw silicon wafers. No contact needed.

Photoluminescence detects wafer defects without electrical contact. Compatible with mono/quasi-mono/multi.

Key Features

  • No contact
  • PL correlation
  • High sensitivity
  • All silicon types
  • Inline ready
  • 980nm laser

Technical Specifications

Size156-210mm
Crack>=50um
Speed0.5-2s
Camera1K InGaAs
Source980nm
Weight20kg

Interested in SC-SPL?

Contact us for pricing, demonstrations, or technical consultation.

Get in Touch