SC-PLEL-PS
PL/EL Integrated Tester
SC-PLEL-PS
PL/EL Integrated Tester
Overview
Dual-mode EL+PL for silicon and perovskite cells.
Integrated EL+PL dual-mode imaging. Supports PERC/TOPCon/HJT/xBC and perovskite. Outputs minority carrier lifetime mapping.
Key Features
- ✓EL+PL dual-mode
- ✓25MP NIR camera
- ✓808nm laser
- ✓<=15s/piece
- ✓All cell types
- ✓MES
Technical Specifications
| Crack | >=50um |
| Power | 1-2kW |
| Camera | 25MP NIR |
| Output | 0-10A/0-30V |
| Weight | 200kg |
| Wavelength | 900-1300nm(Si) |
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